Hochschulschrift
Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements
- Sprache
-
Englisch
- Umfang
-
175 S.
- Maße
-
21 cm
- Anmerkungen
-
Ill., graph. Darst.
Zugl.: Braunschweig, Techn. Univ., Diss., 2011
- ISBN
-
9783863870799
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Erschienen in
-
Berichte aus dem Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik / Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik ; Bd. 36
- Schlagwort
-
Verschiebung
Nanometerbereich
Messung
Kantilever
- Urheber
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
-
mbv, Mensch-und-Buch-Verl.
- (wann)
-
2011
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.03.2025, 12:10 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Objekttyp
- Hochschulschrift
Beteiligte
- Chen, Xiaomei
- mbv, Mensch-und-Buch-Verl.
Entstanden
- 2011
Ähnliche Objekte (12)
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Atomic Force Microscopy (AFM)
Atomic resolution AFM in liquids
AFM's path to atomic resolution
A metrological atomic force microscope system
Interferometrie detection and control of cantilever displacement in NC-AFM applications
Atomic and molecular manipulation with a scanning tunneling microscope
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Magnetoresistance of atomic structures studied with a Scanning Tunneling Microscope
Real-time tracking of atomic electron dynamics
AFM and SPR on biological systems : applying atomic force microscopy (AFM) and surface plasmon resonance (SPR) to biologically important systems
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Atomic Force Microscopy (AFM)
Atomic resolution AFM in liquids
AFM's path to atomic resolution
A metrological atomic force microscope system
Interferometrie detection and control of cantilever displacement in NC-AFM applications
Atomic and molecular manipulation with a scanning tunneling microscope
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Magnetoresistance of atomic structures studied with a Scanning Tunneling Microscope
Real-time tracking of atomic electron dynamics
AFM and SPR on biological systems : applying atomic force microscopy (AFM) and surface plasmon resonance (SPR) to biologically important systems
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Atomic Force Microscopy (AFM)
Atomic resolution AFM in liquids
AFM's path to atomic resolution
A metrological atomic force microscope system
Interferometrie detection and control of cantilever displacement in NC-AFM applications
Atomic and molecular manipulation with a scanning tunneling microscope
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Magnetoresistance of atomic structures studied with a Scanning Tunneling Microscope
Real-time tracking of atomic electron dynamics