Hochschulschrift
Atomic force microscope (AFM) cantilevers as encoder for real-time displacement measurements
- Language
-
Englisch
- Extent
-
175 S.
- Dimensions
-
21 cm
- Notes
-
Ill., graph. Darst.
Zugl.: Braunschweig, Techn. Univ., Diss., 2011
- ISBN
-
9783863870799
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Bibliographic citation
-
Berichte aus dem Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik / Institut für Elektrische Messtechnik und Grundlagen der Elektrotechnik ; Bd. 36
- Keyword
-
Verschiebung
Nanometerbereich
Messung
Kantilever
- Creator
- Event
-
Veröffentlichung
- (where)
-
Berlin
- (who)
-
mbv, Mensch-und-Buch-Verl.
- (when)
-
2011
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 12:10 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Chen, Xiaomei
- mbv, Mensch-und-Buch-Verl.
Time of origin
- 2011
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Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
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Atomic resolution AFM in liquids
AFM's path to atomic resolution
Interferometrie detection and control of cantilever displacement in NC-AFM applications
Atomic and molecular manipulation with a scanning tunneling microscope
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Magnetoresistance of atomic structures studied with a Scanning Tunneling Microscope
Real-time tracking of atomic electron dynamics
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Processing and analysis of long-range scans with an atomic force microscope (AFM) in combination with nanopositioning and nanomeasuring technology for defect detection and quality control
Atomic Force Microscope (AFM) Cantilevers as Encoder for Real-Time Displacement Measurements
Atomic Force Microscopy (AFM)
Atomic resolution AFM in liquids
AFM's path to atomic resolution
Interferometrie detection and control of cantilever displacement in NC-AFM applications
Atomic and molecular manipulation with a scanning tunneling microscope
Investigation of biological macromolecules using atomic force microscope-based techniques
Nanomachining of mesoscopic electronic devices using an atomic force microscope
Magnetoresistance of atomic structures studied with a Scanning Tunneling Microscope
Real-time tracking of atomic electron dynamics
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