The role of defects in fluorescent silicon carbide layers grown by sublimation epitaxy
- Sprache
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Englisch
- Identifier
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1075510791
- Thema
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-
- Beteiligte Personen und Organisationen
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Schimmel, Saskia
Kaiser, Michl
Jokubavicius, V.
Ou, Y.
Hens, P.
Linnarsson, M. K.
Sun, J.
Liljedahl, R.
Ou, H.
Syväjärvi, M.
Wellmann, Peter
- URN
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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26.01.2023, 13:57 MEZ
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Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Schimmel, Saskia
- Kaiser, Michl
- Jokubavicius, V.
- Ou, Y.
- Hens, P.
- Linnarsson, M. K.
- Sun, J.
- Liljedahl, R.
- Ou, H.
- Syväjärvi, M.
- Wellmann, Peter
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