Monografie
Charge carrier dynamics and defect generation at the Si/SiO2 interface proped by femtosecond optical second harmonic generation
- Sprache
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Englisch
- Anmerkungen
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Jena, Univ., Diss., 2005
- Identifier
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976450127
- Thema
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Silicium ; Siliciumdioxid ; Grenzfläche ; Ladungsträger ; Frequenzumsetzung ; Silicium-Siliciumdioxid-Grenzfläche ; Frequenzverdopplung; Hochschulschrift; Online-Publikation
- Beteiligte Personen und Organisationen
- URN
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
26.01.2023, 13:55 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Monografie
Beteiligte
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