Statistical Analysis on the Structural Size of Simulated Thin Film Growth with Molecular Dynamics for Glancing Angle Incidence Deposition
- Sprache
-
Englisch
- Identifier
-
1239420048
Beteiligte Personen und Organisationen
Badorreck, Holger
Jensen, Lars
Ristau, Detlev
Jupé, Marco
Jensen, Lars
Ristau, Detlev
Jupé, Marco
- DOI
-
10.15488/11209
- URN
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
26.01.2023, 13:54 MEZ
Beteiligte
- Badorreck, Holger
- Jensen, Lars
- Ristau, Detlev
- Jupé, Marco
Ähnliche Objekte (12)
Impact of deposition conditions on nanostructured anisotropic silica thin films in multilayer interference coatings
Electrical and optical properties linked to laser damage behavior in conductive thin film materials
Higher certainty of the laser-induced damage threshold test with a redistributing data treatment
Towards an electro-magnetic field separation of deposited material implemented in an ion beam sputter process
Spatial separation effects in a guiding procedure in a modified ion-beam-sputtering process
Prevention of laser damage precursors in spaceborne ultraviolet antireflection coatings
Ultrafast switching with nonlinear optics in thin films
Continuous detection of particles on a rotating substrate during thin film deposition
Group delay dispersion monitoring for computational manufacturing of dispersive mirrors
Standardization in optics characterization
Investigation of target erosion profiles sputter-eroded by a low-energy broad ion beam
Influence of Pumping Regime on Temperature Resolution in Nanothermometry
Impact of deposition conditions on nanostructured anisotropic silica thin films in multilayer interference coatings
Electrical and optical properties linked to laser damage behavior in conductive thin film materials
Higher certainty of the laser-induced damage threshold test with a redistributing data treatment
Towards an electro-magnetic field separation of deposited material implemented in an ion beam sputter process
Spatial separation effects in a guiding procedure in a modified ion-beam-sputtering process
Prevention of laser damage precursors in spaceborne ultraviolet antireflection coatings
Ultrafast switching with nonlinear optics in thin films
Continuous detection of particles on a rotating substrate during thin film deposition
Group delay dispersion monitoring for computational manufacturing of dispersive mirrors
Standardization in optics characterization
Investigation of target erosion profiles sputter-eroded by a low-energy broad ion beam
Influence of Pumping Regime on Temperature Resolution in Nanothermometry
Impact of deposition conditions on nanostructured anisotropic silica thin films in multilayer interference coatings
Electrical and optical properties linked to laser damage behavior in conductive thin film materials
Higher certainty of the laser-induced damage threshold test with a redistributing data treatment
Towards an electro-magnetic field separation of deposited material implemented in an ion beam sputter process
Spatial separation effects in a guiding procedure in a modified ion-beam-sputtering process
Prevention of laser damage precursors in spaceborne ultraviolet antireflection coatings
Ultrafast switching with nonlinear optics in thin films
Continuous detection of particles on a rotating substrate during thin film deposition
Group delay dispersion monitoring for computational manufacturing of dispersive mirrors
Standardization in optics characterization
Investigation of target erosion profiles sputter-eroded by a low-energy broad ion beam